Fine mapping of high-temperature adult-plant resistance to stripe rust in wheat cultivar Louise

• Autorzy: Nazarov T. , Chen X. , Carter A. , See D.
• Języki publikacji: EN

Abstrakty

EN

• Wydawca: -
• Czasopismo: Journal of Plant Protection Research
• Rocznik: 2020
• Tom: 60
• Numer: 2
• Opis fizyczny: p.126-133,fig.,ref.

Twórcy

autor

Nazarov T.

• Department of Plant Pathology, Washington State University, Washington, United States

autor

Chen X.

• Institute of Biological Chemistry, Washington State University, Washington, United States

autor

Carter A.

• Wheat Health, Genetics, and Quality Research Unit, USDA-ARS, United States

autor

See D.

• Department of Crop and Soil Sciences, Washington State University, Washington, United States

Identyfikatory

DOI

10.24425/jppr.2020.132213