EN
NC-AFM (non contact atomic force microscopy) was used to observe the surface of triticale starch granules. The method allows to obtain micro-images of high resolution with no sample pretreatment. Surface structures and protrusions or pores found on the surface of triticale starch granules had a broad range of diameters. The existence of flat, smooth regions on the starch granules, with no visible structures, pores or protrusions, was confirmed.